Neil Loxley: search on Z-Library

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1

Rapid high-resolution X-ray diffraction measurement and analysis of MOVPE pHEMT structures using a high-brilliance X-ray source and automatic pattern fitting

Tamzin Lafford, Mark Taylor, John Wall, Neil Loxley

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 168 KB

english, 2000

2

High resolution X-ray diffraction using a high brilliance source, with rapid data analysis by auto-fitting

Mark Taylor, John Wall, Neil Loxley, Matthew Wormington, Tamzin Lafford

Journal:

Materials Science and Engineering: B

Year:

2001

Language:

english

File:

PDF, 235 KB

english, 2001

3

Application of triple axis HRXRD to the study of II–VI & III–V substrates & devices

Journal:

Year:

1994

Language:

english

File:

PDF, 840 KB

english, 1994

4

The Contrast of Dislocations in X-Ray Topographs of Homogeneously Bent Silicon Crystals

Loxley, Neil, Tanner, Brian K.

Journal:

MRS Proceedings

Year:

1986

Language:

english

File:

PDF, 1.90 MB

english, 1986

5

The Performance of Channel Cut Collimators for Precision X-Ray Diffraction Studies of Epitaxial Layers

Loxley, Neil, Bowen, D. Keith, Tanner, Brian K.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 359 KB

english, 1990

6

Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization

Loxley, Neil, Bowen, D. Keith, Tanner, Brian K.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 386 KB

english, 1990

7

Principles and Performance of a PC-Based Program for Simulation of Double-Axis X-Ray Rocking Curves of Thin Epitaxial Films

Bowen, D. Keith, Loxley, Neil, Tanner, Brian K., Cooke, Lynne, Capano, Michael A.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 434 KB

english, 1990

8

X-Ray Reflectometry from Semiconductor Surfaces and Interfaces

Tanner, Brian K, Miles, Simon J, Bowen, D Keith, Hart, Linda, Loxley, Neil

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 342 KB

english, 1990

9

X-Ray Double Crystal Topography of Processed Silicon Wafers

Loxley, Neil, Tanner, Brian K.

Journal:

MRS Proceedings

Year:

1986

Language:

english

File:

PDF, 2.77 MB

english, 1986

10

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Advances in Laboratory-based X-Ray Sources and Optics - Microfocusing with grazing incidence x-ray micromirrors

Pina, Ladislav, Inneman, Adolf V., Hudec, Rene, Arndt, Ulrich W., Loxley, Neil, Fraser, Graham, Taylor, Mark, Wall, John, MacDonald, Carolyn A., Khounsary, Ali M.

Year:

2000

Language:

english

File:

PDF, 978 KB

english, 2000

11

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advances in Laboratory-Based X-Ray Sources and Optics III - Innovative x-ray optics for laboratory

Pina, Ladislav, Inneman, Adolf V., Hudec, Rene, Ticha, Hana, Arndt, Ulrich W., Loxley, Neil, Fraser, Graham, Taylor, Mark, Wall, John, Khounsary, Ali M., MacDonald, Carolyn A.

Year:

2002

Language:

english

File:

PDF, 618 KB

english, 2002